Normy DIN - Německé národní normy - strana 2679

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles.

Norma vydaná dňa 1.11.1995

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters.

Norma vydaná dňa 1.10.2009

Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method.

Norma vydaná dňa 1.8.2023

Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method.

Norma vydaná dňa 1.8.2023

Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods.

Norma vydaná dňa 1.10.2009

Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists.

Norma vydaná dňa 1.11.1999

Capacitance graded outdoor bushing 52 kV up to 420 kV for oil immersed transformers.

Norma vydaná dňa 1.12.2006

VDE V 0831-459-1. Railway applications - Communication, signalling and processing systems - European Rail Traffic Management System - Driver-Machine Interface - Part 1: General principles for the presentation of ERTMS/ETCS/GSM-R information.

Norma vydaná dňa 1.5.2022

VDE V 0831-459-2. Railway applications - Communication, signalling and processing systems - European Rail Traffic Management System - Part 2: Ergonomic arrangements of GSM-R information.

Norma vydaná dňa 1.5.2022

VDE V 0831-459-3. Railway applications - Communication, signalling and processing systems - European Rail Traffic Management System - Part 3: Ergonomic arrangements of non ETCS information.

Norma vydaná dňa 1.5.2022