Normy DIN - Německé národní normy - strana 2678

Straight thermocouple assembly with metal or ceramic protection tube and accessories.
(Sestavy přímých termočlánků s kovovou nebo keramickou ochrannou trubkou a příslušenstvím..)

Norma vydaná dňa 1.4.2007

Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 2: Determination of Oxygen impurities in Nitrogen, Argon, Helium, Neon and Hydrogen using a galvanic cell.

Norma vydaná dňa 1.3.2026

Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C1-C3-hydrocarbons in gaseous hydrogen chloride by gaschromatography.

Norma vydaná dňa 1.7.2021

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS.

Norma vydaná dňa 1.11.2014

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS).

Norma vydaná dňa 1.9.2024

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram.

Norma vydaná dňa 1.8.2022

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH4; F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid.

Norma vydaná dňa 1.11.2014

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS.

Norma vydaná dňa 1.4.2018

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS.

Norma vydaná dňa 1.8.2022

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 9: Determination of 40 elements in hydrogen peroxide by ICP-MS.

Norma vydaná dňa 1.11.2026