Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
(Dispositifs a semiconducteurs - Criteres de reconnaissance non destructifs des defauts au sein d’une plaquette homoepitaxiale de carbure de silicium pour des dispositifs d’alimentation - Partie 3 : Methode d’essai pour les defauts a l’aide de la photoluminescence)

Norma vydaná dňa 13.7.2020

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

Norma vydaná dňa 27.7.2022

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 5: Test method for defects using X-ray topography

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Industrial-process measurement, control and automation - Framework for functional safety and security

Norma vydaná dňa 20.5.2019

Ultrasonics - Field characterization - Infrared imaging techniques for determining temperature elevation in tissue-mimicking material and at the radiation surface of a transducer in still air

Norma vydaná dňa 15.2.2019

Power supplying scheme for wearable system and equipment

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Photonic integrated circuits - Part 1: Introduction and roadmap for standardization

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Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1: Cardiac SPECT
(Dispositifs d´imagerie par radionucleides dedies - Caracteristiques et conditions d´essai - Partie 1: SPECT pour scintigraphie cardiaque)

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Safety of machinery - Security aspects related to functional safety of safety-related control systems

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Superconducting AC power cables and their accessories for rated voltages from 6 kV to 500 kV - Test methods and requirements

Norma vydaná dňa 5.2.2019