Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications.

NEPLATNÁ vydaná dňa 15.11.1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications.

NEPLATNÁ vydaná dňa 15.11.1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A.

NEPLATNÁ vydaná dňa 15.2.1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A.

NEPLATNÁ vydaná dňa 15.2.1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A.

NEPLATNÁ vydaná dňa 31.1.1992

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz.

NEPLATNÁ vydaná dňa 15.12.1988

General criteria for the assessment of testing laboratories.

NEPLATNÁ vydaná dňa 31.10.1989

General criteria for laboratory accreditation bodies.

NEPLATNÁ vydaná dňa 31.10.1989

Hydraulic fluid power. Four-screw, one-piece square flange connections for use at pressures of 25 MPa and 40 MPa (250 bar and 400 bar).

NEPLATNÁ vydaná dňa 15.3.1995

Gas analysis. Vocabulary.
(Analýza plynů. Terminologie.)

NEPLATNÁ vydaná dňa 16.1.2002