Ih??katop ?hakoc?hte??py???e. Meto? ??mepeh?? ? oppe?e?eh?? papametpob, xapaktep??y???x ka?ectbo otobpa?aemo? ?hfopma??? ? ha?e?hoct? ee bocpp??t??

Norma vydaná dňa 1.3.2025

Silicon is a semiconductor. Method of measuring the concentration of impurities

Norma vydaná dňa 1.3.2025

Cryoelectronic and thermoelectronic cooled products. Methods of measuring noise temperature in the range 4—100 K

Norma vydaná dňa 1.3.2025

Sign-synthesizing gas-discharge indicators. Methods of quality assessment in the control of electrical parameters

Norma vydaná dňa 1.3.2025

Electronic equipment products. Electrochemical method for determining the quality index of coatings

Norma vydaná dňa 1.3.2025

Resists for integrated circuits, semiconductor devices and photomasks. General technical requirements

Norma vydaná dňa 1.3.2025

D.c. bridges for measuring resistance

Norma vydaná dňa 1.7.1995

Electronic materials. Ceramics and parts made from it. General technical requirements

Norma vydaná dňa 1.3.2025

Mebe?? ? hemexah??eckoe obopy?obah?e cy?obx pome?eh??. Fyhk??oha??he pa?mep

Norma vydaná dňa 1.12.2024

Gophoe ?e?o. Meto? oppe?e?eh?? p?cka ?aga??pobah?? gophx bpabotok. Ob??e pp?h??p

Norma vydaná dňa 1.11.2024