Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
(Dispositifs a semiconducteurs - Dispositifs a semiconducteurs pour systeme IDO - Partie 1: Methode d’essai de detection de variation acoustique)

Norma vydaná dňa 14.12.2022

Industrial process measurement, control and automation - Digital nameplate
(Mesurage, commande et automatisation dans les processus industriels – Plaque signaletique numerique)

Norma vydaná dňa 18.10.2022

Product category rules for life cycle assessment of electrical and electronic products and systems
(Regles de definition des categories de produits pour l´analyse du cycle de vie des produits et systemes electriques et electroniques)

Norma vydaná dňa 6.6.2025

Fibre optic interconnecting devices and passive components - Summarising results of round robin on connector end face scratch recognition and verification by automated microscopes

Norma vydaná dňa 22.11.2021

Control and protection systems for high-voltage direct current (HVDC) power transmission systems - Off-site real-time simulation testing

Norma vydaná dňa 27.9.2024

Lithium-ion batteries and charging systems - Safety
(Batteries lithium-ion et systemes de charge – Securite)

Norma vydaná dňa 26.4.2022

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
(Lignes directrices pour les methodes d’essai de resistance dynamique a l’etat passant des dispositifs de conversion de puissance fondes sur les HEMT en GaN)

Norma vydaná dňa 10.2.2022

Industrial facility energy management system (FEMS) - Functions and information flows
(Systeme de gestion d´energie des installations industrielles (FEMS) - Fonctions et flux d’informations)

Norma vydaná dňa 16.8.2023

Procedures for the assessment of human exposure to electromagnetic fields from radiative wireless power transfer systems – Measurement and computational methods (frequency range of 30 MHz to 300 GHz)

Norma vydaná dňa 4.11.2022

Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages

Norma vydaná dňa 14.12.2021