Refractory products—Determination by inductively coupled plasma atomic emission spectrometry(ICP-AES)

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Families and products of ECL circuits for semiconductor integrated circuits

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Series and products for semiconductor CMOS integrated circuits—Products of families 4000

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Families and variety of operational amplifier for semiconductor integrated circuits

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Non-destructive testing—Test method for frequency scanning eddy current testing

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Non-destructive testing—Terminology—Terms used in industrial computed tomography testing

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Families and products of MOS memory for semiconductor integrated circuits

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Families and products of bipolar memory for semiconductor integrated circuits

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General principles of measuring methods of TTL circuits for semiconductor integrated circuits

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Temperature control facilities of pharmaceutical products cold chain logistics—Specification for performance qualification

NEPLATNÁ vydaná dňa 14.10.2017