Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave mixer diodes (pulse operation).

NEPLATNÁ vydaná dňa 8.2.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave detector diodes.

NEPLATNÁ vydaná dňa 5.2.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave passive limiter diodes.

NEPLATNÁ vydaná dňa 30.4.1990

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave active switching diodes.

NEPLATNÁ vydaná dňa 1.4.1976

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation).

NEPLATNÁ vydaná dňa 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation).

NEPLATNÁ vydaná dňa 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation).

NEPLATNÁ vydaná dňa 15.10.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (pulse operation).

NEPLATNÁ vydaná dňa 15.10.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes for frequency multiplication.

NEPLATNÁ vydaná dňa 1.12.1988

Tests for geometrical properties of aggregates. Determination of particle size distribution. Sieving method.
(Zkoušení geometrických vlastností kameniva - Část 1: Stanovení zrnitosti - Sítový rozbor.)

NEPLATNÁ vydaná dňa 15.3.2006