Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high frequency, low power transistors.

NEPLATNÁ vydaná dňa 15.1.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for linear applications.

NEPLATNÁ vydaná dňa 1.5.1976

Banking. Banking telecommunication messages. Bank identifier codes.

NEPLATNÁ vydaná dňa 15.10.1997

Banking. Banking telecommunication messages. Business identifier code (BIC).

NEPLATNÁ vydaná dňa 31.1.2010

Banking. Banking telecommunication messages. Business identifier code (BIC).

NEPLATNÁ vydaná dňa 31.12.2014

Optics and optical instruments. Contact lenses. Determination of cytotoxicity of contact lens material. Agar overlay test and growth inhibition test.
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for switching applications.

NEPLATNÁ vydaná dňa 1.1.1982

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors.

NEPLATNÁ vydaná dňa 1.1.1982

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level.

NEPLATNÁ vydaná dňa 15.7.1978

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level.

NEPLATNÁ vydaná dňa 15.7.1978