Normy ASTM - Americké technické normy - strana 8324

Test Methods for Testing Photoresists Used in Microelectronic Fabrication (Withdrawn 1996)

Standard Practice for Comparing Particle Size in the Use of Alternative Types of Particle Counters

NEPLATNÁ vydaná dňa 28.1.1983

Standard Practice for Comparing Particle Size in the Use of Alternative Types of Particle Counters (Includes all amendments And changes 8/16/2017).

NEPLATNÁ vydaná dňa 28.1.1983

Standard Practice for Comparing Particle Size in the Use of Alternative Types of Particle Counters

NEPLATNÁ vydaná dňa 15.6.2007

Standard Practice for Comparing Particle Size in the Use of Alternative Types of Particle Counters

NEPLATNÁ vydaná dňa 1.1.2013

Practice for Particle Count and Size Distribution Measurement in Batch Samples for Filter Evaluation Using an Optical Particle Counter (Withdrawn 2001)

NEPLATNÁ vydaná dňa 1.1.1992

Test Method for Measurement of Particle Count and Size Distribution in Batch Samples for Filter Evaluation Using an Electrical Resistance Particle Counter (Withdrawn 2001)

NEPLATNÁ vydaná dňa 1.1.1992

Practice for Manual Analysis of Interferometric Data by Least-Squares Fitting to a Plane Reference Surface (Withdrawn 1994)

Practice for Manual Analysis of Interferometric Data by Least-Squares Fitting to a Plane Reference Surface (Includes all amendments And changes 8/13/2021).

NEPLATNÁ vydaná dňa 1.1.1987

Practice for Manual Analysis of Interferometric Data by Least-Squares Fitting to a Spherical Reference Surface and for Computer-Aided Analysis of Interferometric Data by Least-Squares Fitting to Both Plane and Spherical Reference Surfa (Withdrawn 1994)