Cookies
Potrebujeme váš súhlas na využitie jednotlivých dát, aby sa vám okrem iného mohli ukazovať informácie týkajúce sa vašich záujmov. Súhlas udelíte kliknutím na tlačidlo „OK“.
IEEE 2427-2025
IEEE Standard for Analog Defect Modeling and Coverage
NORMA vydaná dňa 9.1.2026
Informácie o norme:
Označenie normy: IEEE 2427-2025
Dátum vydania normy: 9.1.2026
Kód tovaru: NS-1254047
Počet strán: 112
Približná hmotnosť: 367 g (0.81 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEEE
Anotácia textu normy IEEE 2427-2025 :
New IEEE Standard - Active.
A defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs) is defined in this standard. The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified and dozens of commonly used terms are clearly defined to aid communication about the quality of tested ICs.
ISBN: 979-8-8557-2362-5, 979-8-8557-2776-0, 979-8-8557-2777-7
Number of Pages: 112
Product Code: STDAPE28057, STD28383, STDPD28383
Keywords: AMS test, analog/mixed-signal test, analog test coverage, defect coverage, defective parts per million, design for test, DFT, DPPM, IEEE 2427(TM)
Category: Test Instrumentation and Techniques|Test Technology
Draft Number: P2427/D0.42, June 2025 - APPROVED DRAFT
Doporučujeme:
