IEEE 1149.7-2022

Anotácia textu normy IEEE 1149.7-2022 :

Revision Standard - Active.
Circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1 is described in this standard. The circuitry
uses IEEE Std 1149.1 as its foundation, providing complete backward compatibility, while aggressively adding features to support test and applications debug. It defines six classes of IEEE 1149.7 Test Access Ports (TAP.7s), T0 to T5, with each class providing incremental capability, building on that of the lower level classes. Class T0 provides the behavior specified by 1149.1 from startup when there are multiple on-chip TAPs. Class T1 adds common debug functions and features to minimize power consumption. Class T2 adds operating modes that maximize scan performance. It also provides an optional hot-connection capability to prevent system corruption when a connection is made to a powered system. Class T3 supports operation in either a four-wire Series or Star Scan Topology. Class T4 provides for communication with either a two-pin or four-pin interface. The two-pin operation serializes IEEE 1149.1 transactions and provides for higher Test Clock rates. Class T5 adds the ability to perform data transfers concurrently with scan, supports utilization of functions other than scan, and provides control of TAP.7 pins to custom debug technologies in a manner that ensures current and future interoperability.

ISBN: 978-1-5044-8875-4, 978-1-5044-8876-1
Number of Pages: 1048
Product Code: STD25536, STDPD25536
Keywords: 2-pin, 2-wire, 4-pin, 4-wire, Advanced Protocol, Advanced Protocol Unit, APU, Background Data Transfer, background data transport, BDX, boundary scan, BSDL, BSDL.1, BSDL.7, BYPASS, Capture-IR, CDX, Chip-Level TAP Controller, CID, Class T0, Class T1, Class T2, Class T3, Class T4, Class T5, CLTAPC, compact JTAG, compliant behavior, compliant operation, control level, controller address, Controller ID, Controller Identification Number, CP, Custom Data Transfer, custom data transport, Data Register, debug interface, debug logic, debug and test interface, DOT1, DOT7, DTI, DTS, DTT, Debug Test System, debug test target, Escape, EOT, EPU, extended operation, Extended Protocol, EXTEST, four-pin, four-wire, HSDL, HSDL.7, IDCODE, IEEE 1149.1, IEEE 1149.7, Instruction Register, JScan, JScan0, JScan1, JScan2, JScan3, JTAG, MScan, MTCP, Multi-TAP Control Path, narrow Star Scan Topology, nTRST, nTRST_PD, optimized scan, OScan, OScan0, OScan1, OScan2, OScan3, OScan4, OScan5, OScan6, OScan7, Pause-DR, Pause-IR, PC0, PC1, RSU, Reset and selection unit, RTI, Run- Test/Idle, scan, scan DR, scan format, scan IR, Scan Packet, scan path, scan performance, scan protocol, scan topology, series, Series Branch, Series Scan, Series Scan Topology, Series- Equivalent Scan, Series Topology, Shift-DR, Shift-IR, SiP, Star Scan, Star Scan Topology, Star Topology, Star-2, Star-2 Branch, Star-2 Scan, Star-4, Star-4 Branch, Star- 4 Scan, Star-4 Scan Topology, SP, SScan, SScan0, SScan1, SScan2, SScan3, stall, SSD, Scan Selection Directive, Standard Protocol, STL, System Test Logic, TAP, TAP controller, TAP controller address, TAP selection, TAP.1, TAP.7, TAPC, TCA, TCK, TCKC, TDI, TDIC, TDOC, TDOE, Test Access Port, test and debug, Test-Logic-Reset, TLR, TMSC, Transport Packet, T0, T0 TAP.7, T1, T1 TAP.7, T2, T2 TAP.7, T3, T3 TAP.7, T4, T4 TAP.7, T4(N), T4(N) TAP.7, T4(W), T4(W) TAP.7, T5, T5 TAP.7, T5(N), T5(N) TAP.7, T5(W), T5(W) TAP.7, TP, two-pin, two-wire, Update-DR, Update-IR, ZBS, zero bit scan
Category: Test Technology