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IEC/TS 62607-6-20-ed.1.0
Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry
NORMA vydaná dňa 11.10.2022
Informácie o norme:
Označenie normy: IEC/TS 62607-6-20-ed.1.0
Dátum vydania normy: 11.10.2022
Kód tovaru: NS-1092140
Počet strán: 28
Približná hmotnosť: 84 g (0.19 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC
Kategórie - podobné normy:
Anotácia textu normy IEC/TS 62607-6-20-ed.1.0 :
IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic - metallic impurity content for powders of graphene-based materials by - inductively coupled plasma mass spectrometry (ICP-MS). The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS. - The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO). – The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.
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