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IEC/TR 63357-ed.1.0
Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
NORMA vydaná dňa 11.10.2022
Informácie o norme:
Označenie normy: IEC/TR 63357-ed.1.0
Dátum vydania normy: 11.10.2022
Kód tovaru: NS-1091998
Počet strán: 14
Približná hmotnosť: 42 g (0.09 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC
Kategórie - podobné normy:
Anotácia textu normy IEC/TR 63357-ed.1.0 :
IEC TR 63357:2022(E) describes standardization roadmap of fault test methods for integrated circuits used in automotive vehicles. Since automotive vehicles are exposed in harsh environment such as very low or high temperature, vibration, high frequency signals, etc. Therefore, they are tested for possible faults which can be caused by harsh environment. There are several fault test methods and related issues to be standardized. Semiconductor devices used in automotive vehicles are exposed in harsh environment of very high or very low temperature, vibration, high frequency signals, etc. Therefore, they are tested for possible faults which can be caused by harsh environment Evaluation results following this fault test methods will provide robustness of the semiconductor device.
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