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ASTM F980-92

Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Automaticky preložený názov:

Sprievodca pre meranie Rapid Žíhanie Neutron vyvolané objemového škodu v Silicon polovodičových súčiastok

NORMA vydaná dňa 1.1.1992

Jazyk
Prevedenie	Elektronické PDF - 68.90 € Tlačené - 68.90 €
Dostupnosť	SKLADOM
Cena	68.90 € bez DPH
68.90 €

Informácie o norme:

Označenie normy: ASTM F980-92
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.1.1992
Kód tovaru: NS-57153
Počet strán: 5
Približná hmotnosť: 15 g (0.03 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM

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Anotácia textu normy ASTM F980-92 :

Keywords:
Annealing, Defects-semiconductors, Destructive testing-semiconductors, Displacement damage, Electrical conductors-semiconductors, Electronic hardness, Hardness tests-radiation (of semiconductors), Integrated circuits, Neutron radiation, Pulsed neutron-radiation source, Radiation exposure-electronic components/devices, Radiation-hardness testing, Short term damage, Vulnerability, rapid annealing of neutron-induced displacement damage in semiconductor, devices, guide,, Rapid annealing effects

Doplňujúce informácie

1. Scope

1.1 This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.

1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard information is given in 4.2.7.

2. Referenced Documents

E666-21	Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
E1855-20	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
E722-19	Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
E1894-18	Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
E721-22	Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
F1032-91	Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
E720-23	Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E1854-19	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
E265-15(2020)	Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E264-19	Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel

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