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ASTM E766-98
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Automaticky preložený názov:
Štandardná prax pre kalibráciu zväčšenie skenovacieho elektrónového mikroskopu
NORMA vydaná dňa 10.12.1998
Informácie o norme:
Označenie normy: ASTM E766-98
Poznámka: NEPLATNÁ
Dátum vydania normy: 10.12.1998
Kód tovaru: NS-47926
Počet strán: 6
Približná hmotnosť: 18 g (0.04 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Anotácia textu normy ASTM E766-98 :
Keywords:
Calibration-microscopes, Scanning electron microscope (SEM), scanning electron microscopes (SEM´s), practice,, Electron microscopy, Scanning electron microscope (SEM), calibrating the magnification of scanning electron microscopes (SEM´s),, practice, ICS Number Code 37.020 (Optical equipment)
Doplňujúce informácie
| 1. Scope | ||||||||||||
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1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and magnification indicated on the SEM readout may be different at different magnifications, this practice must be applied to each magnification for which true magnification is desired. 1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||||||||||||
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