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Standard Test Method for Normal Spectral Emittance at Elevated Temperatures
Automaticky preložený názov:
Štandardná skúšobná metóda pre normálnu spektrálnu emisivity pri zvýšených teplotách
NORMA vydaná dňa 1.4.2014
Označenie normy: ASTM E307-72(2014)
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.4.2014
Kód tovaru: NS-46353
Počet strán: 6
Približná hmotnosť: 18 g (0.04 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
emittance, infrared emittance, material radiative property, radiative heat transfer, spacecraft thermal control , spectral normal emittance, thermal radiation, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
Significance and Use | ||
5.1 The significant features are typified by a discussion of the limitations of the technique. With the description and arrangement given in the following portions of this test method, the instrument will record directly the normal spectral emittance of a specimen. However, the following conditions must be met within acceptable tolerance: 5.1.1 The effective temperatures of the specimen and blackbody must be within 1 K of each other. Practical limitations arise, however, because the temperature uniformities are often not better than a few degrees Kelvin. 5.1.2 The optical path length in the two beams must be equal, or the instrument should operate in a nonabsorbing atmosphere or a vacuum, in order to eliminate the effects of differential atmospheric absorption in the two beams. Measurements in air are in many cases important, and will not necessarily give the same results as in a vacuum, thus the equality of the optical paths for dual beam instruments becomes very critical. 5.1.3 Front-surface mirror optics
must be used throughout, except for the prism in prism
monochromators and the grating in grating monochromators, and it
should be emphasized that equivalent optical elements must be used
in the two beams in order to reduce and balance attenuation of the
beams by absorption in the optical elements. It is recommended that
optical surfaces be free of SiO2 and SiO coatings;
MgF5.1.4 The source and field apertures
of the two beams must be equal in order to ensure that radiant flux
in the two beams compared by the apparatus will pertain to equal
areas of the sources and equal solid angles of emission. In some
cases it may be desirable to define the solid angle of the source
and sample when comparing alternative measurement techniques.
5.1.5 The response of the detector-amplifier system must vary linearly with the incident radiant flux. |
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1. Scope | ||
1.1 This test method describes a highly accurate technique for measuring the normal spectral emittance of electrically conducting materials or materials with electrically conducting substrates, in the temperature range from 600 to 1400 K, and at wavelengths from 1 to 35 μm. 1.2 The test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is suitable for research laboratories where the highest precision and accuracy are desired, but is not recommended for routine production or acceptance testing. However, because of its high accuracy this test method can be used as a referee method to be applied to production and acceptance testing in cases of dispute. 1.3 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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2. Referenced Documents | ||
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