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ASTM E1505-92(2001)
Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards (Withdrawn 2010)
Automaticky preložený názov:
Štandardné Príručka pre stanovenie SIMS Relatívna faktorov citlivosti od Ion implantovanými externými štandardmi ( Withdrawn 2010 )
NORMA vydaná dňa 15.11.1992
Informácie o norme:
Označenie normy: ASTM E1505-92(2001)
Poznámka: NEPLATNÁ
Dátum vydania normy: 15.11.1992
Kód tovaru: NS-41994
Počet strán: 3
Približná hmotnosť: 9 g (0.02 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Anotácia textu normy ASTM E1505-92(2001) :
Keywords:
SIMS, ICS Number Code 11.040.40 (Implants for surgery, prothetics and orthotics), 71.040.50 (Physicochemical methods of analysis)
Doplňujúce informácie
| 1. Scope | ||
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1.1 The purpose of this guide is to provide the secondary ion mass spectrometry (SIMS) analyst with two procedures for determining relative sensitivity factors (RSFs) from ion implanted external standards. This guide may be used for obtaining the RSFs of trace elements (<1 atomic %) in homogeneous (chemically and structurally) specimens. This guide is useful for all SIMS instruments. 1.2 This guide does not describe procedures for obtaining RSFs for major elements (>1 atomic %). In addition, this guide does not describe procedures for obtaining RSFs from implants in heterogeneous (either laterally or in-depth) specimens. 1.3 The values stated in SI units are to be regarded as the standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||
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