ASTM C657-93(2008)

This experimental procedure yields meaningful data for the dc volume resistivity of glass. It is designed to minimize space charge, buildup polarization effects, and surface conductances. The temperature range is limited to room temperature to the annealing point of the specimen glass.

1.1 This test method covers the determination of the dc volume resistivity of a smooth, preferably polished, glass by measuring the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate sensitivity. This current must be measured under steady-state conditions that is neither a charging current nor a space-charge, buildup polarization current.

1.2 This test method is intended for the determination of resistivities less than 10¹⁶ Ω·cm in the temperature range from 25°C to the annealing point of the glass.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 5.