Surface chemical analysis-Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
NORMA vydaná dňa 20.1.2026
Designation standards: JIS K0160:2026
Publication date standards: 20.1.2026
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Other standards
Kategória: Technické normy JIS