Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Espanola de Normalización in October of 2020.)
NORMA vydaná dňa 1.10.2020
Designation standards: UNE-EN IEC 60749-41:2020
Publication date standards: 1.10.2020
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Spanish technical standard
Kategória: Technické normy UNE