UNE-EN 60749-7:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 7: Internal moisture content measurement and the analysis of other residual gases.

NORMA vydaná dňa 30.5.2003

Anglicky -
Elektronické PDF (55.30 EUR)

Anglicky -

Tlačené (60.80 EUR)

Španielsky -

Elektronické PDF (46.10 EUR)

Španielsky -

Tlačené (50.70 EUR)

The information about the standard:

Designation standards: UNE-EN 60749-7:2003
Note: NEPLATNÁ
Publication date standards: 30.5.2003
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: Spanish technical standard
Kategória: Technické normy UNE