UNE-EN 60749-16:2003

Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)

NORMA vydaná dňa 21.11.2003

The information about the standard:

Designation standards: UNE-EN 60749-16:2003
Publication date standards: 21.11.2003
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Spanish technical standard
Kategória: Technické normy UNE