
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
NORMA vydaná dňa 11.6.2004
Designation standards: UNE-EN 60749-14:2004
Publication date standards: 11.6.2004
The number of pages: 35
Approximate weight : 105 g (0.23 lbs)
Country: Spanish technical standard
Kategória: Technické normy UNE