Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
NORMA vydaná dňa 5.11.2015
Označenie normy: ISO 19830:2015
Dátum vydania normy: 5.11.2015
Počet strán: 22
Približná hmotnosť: 66 g (0.15 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy ISO
Description / Abstract: ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.