American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
NORMA vydaná dňa 20.8.2003
Označenie normy: IEEE/ANSI N42.31-2003
Dátum vydania normy: 20.8.2003
Počet strán: 40
Približná hmotnosť: 120 g (0.26 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEEE
New IEEE Standard - Active.
Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
ISBN: 978-0-7381-3798-8, 978-0-7381-3799-5
Number of Pages: 40
Product Code: STDPD95166, STD95166
Keywords: cadmium telluride, cadmium zinc telluride, CdTe, charged particle, CZT, electron-hole pair, gamma rays, HgI, ionizing radiation, ion pair, MCA, mercuric iodide, multichannel analyzer, semiconductor detector, X-ray
Category: Reactor Instruments and Controls