IEEE 300-1969

USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)

NORMA vydaná dňa 30.11.1968

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The information about the standard:

Designation standards: IEEE 300-1969
Note: NEPLATNÁ
Publication date standards: 30.11.1968
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Kategória: Technické normy IEEE