IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories
NORMA vydaná dňa 27.1.2023
Označenie normy: IEEE 2665-2022
Dátum vydania normy: 27.1.2023
Počet strán: 42
Približná hmotnosť: 126 g (0.28 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEEE
New IEEE Standard - Active.
Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct.
ISBN: 978-1-5044-9369-7, 978-1-5044-9370-3
Number of Pages: 42
Product Code: STD25906, STDPD25906
Keywords: control limits, detection rules, electromagnetic compatibility, EMC, IEEE 2665, individual moving range, quality check, SPC, statistical process control, Walter Shewhart, XmR chart
Category: Electromagnetic Compatibility