IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

The information about the standard:

Designation standards: IEEE 1505.1-2019
Publication date standards: 20.8.2019
The number of pages: 158
Approximate weight : 505 g (1.11 lbs)
Country: International technical standard
Kategória: Technické normy IEEE

Annotation of standard text IEEE 1505.1-2019 :

Revision Standard - Active.
An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).

ISBN: 978-1-5044-5975-4, 978-1-5044-5976-1
Number of Pages: 158
Product Code: STD23757, STDPD23757
Keywords: automatic test equipment (ATE), automatic test systems (ATS), fixture, IEEE 1505.1TM, interconnecting device (ICD), interface, interface test adapter (ITA), mass termination, receiver, scalable, test program set (TPS), unit under test (UUT)
Category: Instrument/Measurement/Testing|Test Instrumentation and Techniques