IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Informácie o norme:

Označenie normy: IEEE 1450.1-2025
Dátum vydania normy: 26.6.2025
Počet strán: 141
Približná hmotnosť: 454 g (1.00 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEEE

Anotácia textu normy IEEE 1450.1-2025 :

Revision Standard - Active.
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

ISBN: 979-8-8557-1473-9, 979-8-8557-2140-9, 979-8-8557-2141-6
Number of Pages: 141
Product Code: STDAPE27495, STD27889, STDPD27889
Keywords: advanced scan architecture, core, environment, fail feedback, IEEE 1450.1, lockstep, parallel patterns, parameterized data, pattern tiling, pragma, signal variable, SoC, system on chip, test protocol
Category: Test Technology
Draft Number: P1450.1/D3, Oct 2024 - APPROVED DRAFT