
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
NORMA vydaná dňa 13.12.1991
Designation standards: IEEE 1181-1991
Note: NEPLATNÁ
Publication date standards: 13.12.1991
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Kategória: Technické normy IEEE