IEC/TS 62607-9-1-ed.1.0

Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy

NORMA vydaná dňa 14.10.2021

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Informácie o norme:

Označenie normy: IEC/TS 62607-9-1-ed.1.0
Dátum vydania normy: 14.10.2021
Počet strán: 63
Približná hmotnosť: 189 g (0.42 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC

Anotácia textu normy IEC/TS 62607-9-1-ed.1.0 :

IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.