IEC/TR 62878-2-7-ed.1.0

Device embedding assembly technology - Part 2-7: Guidelines - Accelerated stress testing of passive embedded circuit boards

NORMA vydaná dňa 20.3.2019

Anglicky -
Elektronické PDF (102.70 EUR)

Anglicky -

Tlačené (102.70 EUR)

Anglicky -

CD-ROM (104.30 EUR)

Informácie o norme:

Označenie normy: IEC/TR 62878-2-7-ed.1.0
Dátum vydania normy: 20.3.2019
Počet strán: 12
Približná hmotnosť: 36 g (0.08 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC

Anotácia textu normy IEC/TR 62878-2-7-ed.1.0 :

IEC TR 62878-2-7:2019 (E) describes the accelerated stress testing of passive embedded circuit boards. It can be used for screening finished boards, including multilayer and high-density interconnection (HDI) boards. These boards are mainly for mobile devices.