EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
NORMA vydaná dňa 26.8.2025
Označenie normy: IEC/TR 62433-4-1-ed.1.0
Dátum vydania normy: 26.8.2025
Počet strán: 40
Približná hmotnosť: 120 g (0.26 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC
IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB. This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.