Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
NORMA vydaná dňa 29.3.2023
Označenie normy: IEC 63287-2-ed.1.0
Dátum vydania normy: 29.3.2023
Počet strán: 30
Približná hmotnosť: 90 g (0.20 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications. L’IEC 63287-2:2023 fournit des lignes directrices pour lelaboration de plans de qualification de la fiabilite a l’aide du concept de profil de mission, sur la base des conditions environnementales et de l’utilisation prevue du produit. Le present document n’est pas destine aux applications militaires et spatiales.