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IEC 62951-6-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

NORMA vydaná dňa 6.5.2019

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The information about the standard:

Designation standards: IEC 62951-6-ed.1.0
Publication date standards: 6.5.2019
The number of pages: 50
Approximate weight : 150 g (0.33 lbs)
Country: International technical standard
Kategória: Technické normy IEC

Annotation of standard text IEC 62951-6-ed.1.0 :

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance. L’IEC 62951-6:2019 specifie les termes, ainsi que la methode et le rapport d’essai de la resistance de couche d’une couche conductrice souple soumise a des essais de courbure et de pliage. Les methodes de mesurage comprennent la methode de la sonde 2 points, la methode de la sonde 4 points et la methode de Montgomery, qui peuvent etre appliquees a un mesurage sur site ou hors site et aux mesurages de resistance de couche anisotrope.