IEC 62951-3-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

NORMA vydaná dňa 7.11.2018

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Informácie o norme:

Označenie normy: IEC 62951-3-ed.1.0
Dátum vydania normy: 7.11.2018
Počet strán: 22
Približná hmotnosť: 66 g (0.15 libier)
Krajina: Medzinárodná technická norma
Kategória: Technické normy IEC

Anotácia textu normy IEC 62951-3-ed.1.0 :

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.