IEC 60759-ed.1.0

Standard test procedures for semiconductor X-ray energy spectrometers

NORMA vydaná dňa 1.1.1983

Anglicky a francúzsky -
Elektronické PDF (385.30 EUR)

Anglicky a francúzsky -

Tlačené (385.30 EUR)

Anglicky a francúzsky -

CD-ROM (386.90 EUR)

The information about the standard:

Designation standards: IEC 60759-ed.1.0
Publication date standards: 1.1.1983
The number of pages: 97
Approximate weight : 322 g (0.71 lbs)
Country: International technical standard
Kategória: Technické normy IEC

Annotation of standard text IEC 60759-ed.1.0 :

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Donne les methodes dessais normalises des spectrometres denergie X a semicteur constitues dun semicteur et de lelectronique de traitement du signal lies par une interface a un analyseur damplitude couple a un calculateur.