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IEC 60749-31-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

NORMA vydaná dňa 30.8.2002

Španielsky -
Elektronické PDF (26.10 EUR)
Španielsky -
Tlačené (26.10 EUR)
Španielsky -
CD-ROM (27.80 EUR)


Anglicky a francúzsky -
Elektronické PDF (26.10 EUR)
Anglicky a francúzsky -
Tlačené (26.10 EUR)
Anglicky a francúzsky -
CD-ROM (27.80 EUR)

The information about the standard:

Designation standards: IEC 60749-31-ed.1.0
Publication date standards: 30.8.2002
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: International technical standard
Kategória: Technické normy IEC

Annotation of standard text IEC 60749-31-ed.1.0 :

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres), cet essai determine si le dispositif prend feu par suite dun echauffement interne du a des surcharges excessives. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.