Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
NORMA vydaná dňa 1.4.1992
Designation standards: IEC 60748-11-1-ed.1.0
Publication date standards: 1.4.1992
The number of pages: 71
Approximate weight : 213 g (0.47 lbs)
Country: International technical standard
Kategória: Technické normy IEC
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification. Le but de ces essais est de verifier la conformite aux exigences de la specification applicable des materiaux internes utilises, de la fabrication et de lassemblage des circuits integres.