IEC 60444-2-ed.1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

NORMA vydaná dňa 1.1.1980

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Anglicky a francúzsky -

Elektronické PDF (51.60 EUR)

Anglicky a francúzsky -

Tlačené (51.60 EUR)

Anglicky a francúzsky -

CD-ROM (53.30 EUR)

The information about the standard:

Designation standards: IEC 60444-2-ed.1.0
Publication date standards: 1.1.1980
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: International technical standard
Kategória: Technické normy IEC

Annotation of standard text IEC 60444-2-ed.1.0 :

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. Decrit une methode de mesure de la capacite dynamique des quartz dans une gamme de frequences de 1 MHz a 125 MHz avec une erreur totale de mesure de lordre de 5%.