GOST R 71334-2024

Epitaxial structures. Method for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference

NORMA vydaná dňa 1.3.2025

Rusky -
Elektronické PDF (46.20 EUR)

Rusky -

Tlačené (46.20 EUR)

Anglicky a rusky -

Elektronické PDF (171.80 EUR)

Anglicky a rusky -

Tlačené (171.80 EUR)

The information about the standard:

Designation standards: GOST R 71334-2024
Publication date standards: 1.3.2025
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: Russian technical standard
Kategória: Technické normy GOST