GB/T 43493.1-2023

Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 1: Classification of defects

NORMA vydaná dňa 28.12.2023

The information about the standard:

Designation standards: GB/T 43493.1-2023
Publication date standards: 28.12.2023
Country: Chinese technical standard
Kategória: Technické normy GB