GB/T 42902-2023

Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method

NORMA vydaná dňa 6.8.2023

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The information about the standard:

Designation standards: GB/T 42902-2023
Publication date standards: 6.8.2023
Country: Chinese technical standard
Kategória: Technické normy GB