GB/T 41751-2022

Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers

NORMA vydaná dňa 12.10.2022

Anglicky a čínsky -
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The information about the standard:

Designation standards: GB/T 41751-2022
Publication date standards: 12.10.2022
Country: Chinese technical standard
Kategória: Technické normy GB