GB/T 4058-1995

Test method for detection of oxidation induced defects in polished silicon wafers

NORMA vydaná dňa 18.4.1995

Anglicky a čínsky -
Elektronické PDF (387.60 EUR)

The information about the standard:

Designation standards: GB/T 4058-1995
Note: NEPLATNÁ
Publication date standards: 18.4.1995
Country: Chinese technical standard
Kategória: Technické normy GB