GB/T 24577-2009

Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography

NORMA vydaná dňa 30.10.2009

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The information about the standard:

Designation standards: GB/T 24577-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Kategória: Technické normy GB