GB/T 17169-1997

Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection

NORMA vydaná dňa 22.12.1997

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The information about the standard:

Designation standards: GB/T 17169-1997
Note: NEPLATNÁ
Publication date standards: 22.12.1997
Country: Chinese technical standard
Kategória: Technické normy GB