GB/T 14863-2013

Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes

NORMA vydaná dňa 31.12.2013

Anglicky a čínsky -
Elektronické PDF (579.90 EUR)

The information about the standard:

Designation standards: GB/T 14863-2013
Note: NEPLATNÁ
Publication date standards: 31.12.2013
Country: Chinese technical standard
Kategória: Technické normy GB