GB/T 14847-1993

Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance

NORMA vydaná dňa 24.12.1993

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The information about the standard:

Designation standards: GB/T 14847-1993
Note: NEPLATNÁ
Publication date standards: 24.12.1993
Country: Chinese technical standard
Kategória: Technické normy GB